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2019.3.20--Design of Fault-Tolerant Neuromorphic Computing Systems

Time: Mar 19, 2019

时间 地点
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Title:

Design of Fault-Tolerant   Neuromorphic Computing Systems

Lecturer:

ishnenduChakrabarty

Location:

Room 219, , Main Building II Zone, North Campus, Xidian University

Time:

2019-03-20   15:00:00

Lecturer    Profile

KrishnenduChakrabarty received the B. Tech. degree from   the Indian Institute of Technology, Kharagpur, in 1990, and the M.S.E. and   Ph.D. degrees from the University of Michigan, Ann Arbor, in 1992 and 1995,   respectively. He is now the William H. Younger Distinguished Professor and   Department Chair of Electrical and Computer Engineering, and Professor of   Computer Science, at Duke University. Prof. Chakrabarty is a recipient of the   National Science Foundation CAREER award, the Office of Naval Research Young   Investigator award, the Humboldt Research Award from the Alexander von   Humboldt Foundation, Germany, the IEEE Transactions on CAD Donald O. Pederson   Best Paper Award (2015), the ACM Transactions on Design Automation of   Electronic Systems Best Paper Award (2017), and over a dozen best paper   awards at major conferences.  He is also a recipient of the IEEE   Computer Society Technical Achievement Award (2015), the IEEE Circuits and   Systems Society Charles A. Desoer Technical Achievement Award (2017), and the   Distinguished Alumnus Award from the Indian Institute of Technology,   Kharagpur (2014). He is a Research Ambassador of the University of Bremen   (Germany) and Hans Fischer Senior Fellow at the Institute for Advanced Study,   Technical University of Munich, Germany. Prof. Chakrabarty served as the   Editor-in-Chief of IEEE Design & Test of Computers during 2010-2012 and   ACM Journal on Emerging Technologies in Computing Systems during 2010-2015.   Currently he serves as the Editor-in-Chief of IEEE Transactions on VLSI   Systems. He is also an Associate Editor of IEEE Transactions on Biomedical   Circuits and Systems, IEEE Transactions on Multiscale Computing Systems, and   ACM Transactions on Design Automation of Electronic Systems.

Lecture   Abstract

The performance of today’s   computing infrastructure is limited by the energy consumption involved in   processing, storing, and moving data. In addition, the exponential increase   in the volume of data must behandled by our computational infrastructure is   driven in large part by machine-learning applications such as deep neural   networks. Conventional computing architectures are unable to deal effectively   or efficiently with this data volume or with the requirement to transform   data into actionable information. Moreover, a major showstopper towards   energy efficient computing is the high error rate associated with traditional   techniques. There is a pressing need to incorporate fault tolerance in   emerging computing architectures and circuit designs.

This talk will first introduce the audience to the   exciting and emerging area of brain-inspired neuromorphic computing systems   for machine-learning hardware. First, the presenter will describe RRAM-based   crossbars and their role in neuromorphic computing systems. Following this,   the need for testing and fault tolerance will be motivated in light of   imperfect fabrication technologies, as well as technology limitations such as   write endurance in RRAM cells. The speaker will present a physics-based   classification and analysis of memristor fault origins. These faults origins   will be systematically attributed to process variations and manufacturing   defects. This study of memristor fault originsand the resulting conclusions   provides valuable feedback forthe fabrication and the design of memristor-based   circuitsandsystems.Fault models and test solutions will be presented.   Subsequently, techniques for online testing and fault-tolerant training will   be described.Finally, time permitting, the speaker will describe an efficient   fault tolerance method inspired by algorithm-based fault tolerance (ABFT),   and referred to as extended-ABFT (X-ABFT), forfault detection and error   correction.

 

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